Experimental methods in semiconductor physics

fizyka

A review of modern experimental techniques available for characterization of semiconductor materials and structures will be given.

The lecture will start with a short reminder of basic properties of solids with a special emphasis on semiconductors and their low-dimensional structures.

Next the following experimental methods will be addressed with some introduction on their physical backgrounds:

• Semiconductors, Semiconductor Nanostructures

• Growth Techniques

• Structural methods:

• Optical methods:

• Electrical methods:

• Measurements in magnetic fields

• Measurements in extreme conditions.

• Semiconductors, Semiconductor Nanostructures

• Growth Techniques

MOCVD, MBE

• Electrical methods:

Conductivity,

photocurrent,

capacitance methods: thermally stimulated capacitance (TSCap), deep level transient spectroscopy (DLTS).

• Measurements in magnetic field:

Hall effect,

quantum Hall effect,

Shubnikov de Haas oscillations of the conductivity,

resonance techniques: EPR, NMR, spin echo, ODMR.

• Measurements in extreme conditions:

High pressure, uniaxial stress,

J. H. Davis, The physics of low-dimensional semiconductors, an introduction, Cambridge University Press, 1998

P. Yu and M. Cardona, Fundamentals of Semiconductors, Physics and Materials Properties, Springer 1999

H.Ibach and H.Lüth, Solid State Physics, An Introduction to Principles of Materials Science, Springer 1995

Characterization of Semiconductor Heterostructures and Nanostructures, C.Lamberti ed. Elsevier 2008

Oral examination

N/A